Publications
Ansari-Asl M., Barbieri M., Obein G. and Hardeberg J., “Advancing Material Appearance Measurement: A Cost-effective Multispectral Imaging System for Capturing SVBRDF and BTF”, London Imaging Meeting 2023, June 2023, London, United Kingdom, Society for Imaging Science and Technology, 104-108, DOI: 10.3390/jimaging10030055.
Basic N., Molloy E., Koo A., Ferrero A., Santafé P., Gevaux L., Porrovecchio G., Schirmacher A., Smid M., Blattner P., Hauer K., Quast T., Campos J. and Obein G., “Intercomparison of bidirectional reflectance distribution function (BRDF) measurements at in- and out-of-plane geometries”, Applied Optics, 2023, DOI: 10.1364/AO.486156.
García-Márquez J. and Valencia-Estrada J.C., "Freeform concentrator design for IR wireless to-fiber link communications", Journal of the Optical Society of America, 2023, A 40, 1741, DOI: 10.1364/JOSAA.495621.
Gevaux L., Saha D., and Obein G., "Investigating the optical translucency of Spectralon using BSSRDF measurements", Applied Optics, 2023, 62, 5003-5013, DOI: 10.1364/AO.491929.
Gozhyk I., Turbil C., Garcia E. and Obein G., “Impact of light polarization on angle-resolved light scattering from gloss scale”, Physica Scripta, 2023, 98, 9, DOI: 10.1088/1402-4896/ace99b.
Khlevnoy B. B., Solodilov M. V., Kolesnikova S. S., Otryaskin D.A., Pons A., Campos J., Shin D. J., Park S., Obein G., Valin M. H., Vissière A., Dai C., Wu Z., Wang Y., Li L., Lin Y., Yoon H., Gibson C., Liu Y., Manson P., Atkinson E., Zama T., Shitomi H., Goodman T., Servantes W., Gamouras A., Woods D. J., Sperfeld P. and Pape S., “CIPM key comparison CCPR-K1.a.2017 for spectral irradiance 250 nm to 2500 nm. Final report”, Metrologia, 2023, 60, 1A, DOI: 10.1088/0026-1394/60/1A/02002.
Lafitte A., Sordello R., Legrand M., Nicolas V., Obein G. and Reyjol Y., “Does a flashing artificial light have more or conversely less impacts on animals than a continuous one? A systematic review”, Nature Conservation, 2023, 54, 49-177. DOI: 10.3897/natureconservation.54.102614.
Molloy E., Koo A., Gevaux L., Obein G. and Yang L., “Use of bidirectional transmittance distribution function measurements to determine transmittance haze”, Metrologia, 2023, 60 055003, DOI: 10.1088/1681-7575/ace910.
Communications
Dubard J., Betis P. and Garcia-Marquez J., “Metrology for emerging PV applications”, Congrès international de métrologie (CIM 2023), Lyon, France, 7-10 mars 2023.
Eloi F. and Dubard J., “Revision and extension of standards for test methods for LED lamps, luminaires and modules”, Congrès international de métrologie (CIM 2023), Lyon, France, 7-10 mars 2023.
Gevaux L., Dupiau A., Morvan K. and Obein G., “The measurement of specular gloss using a conoscopic goniospectrophotometer”, London Imaging Meeting 2023, Society for Imaging Science and Technology, London, United Kingdom, juin 2023, Proceedings: 10-14.
Obein G., “Physics and Measurement of properties linked to appearance”, London Imaging Meeting 2023, Society for Imaging Science and Technology, London, United Kingdom, juin 2023, Proceedings: 1-4.
Ferrero A., Gevaux L., Rastgou M., Jaanimets M., Jurgo I., Manoocheri F., Kubarsepp T., Nilsson A., Szaina G. and Obein G., “Preliminary study for traceability on specular gloss”, CIE Conference 2023, 30th Session, Ljubjiana, Slovenia, septembre 2023.
Gevaux L., Morvan K., Dupiau A., Saha D., Frisvad J.R. and Obein G., “Method for traceability of multiscale bidirectional reflectance distribution function measurements”, CIE Conference 2023, 30th Session, Ljubjiana, Slovenia, septembre 2023.
Saez, A.M., Ferrero, A., Ledig, J., Schrader, C., Gevaux L., Dupiau, A., Maltezos, E., Antonopoulos, M., Rezazadeh, Y. and Bouroussis C., “Framework for evaluation of procedures for HDR luminance imaging measurements”, CIE Conference 2023, 30th Session, Ljubjiana, Slovenia, septembre 2023.
Chasseigne R., Renoux R., Pierrard S., Betis P., Garcia-Marquez J., Dubard J. and Hay B.,
“Airborne luminancemeter for obtrusive light measurements”, CIE Conference 2023, 30th Session, Ljubjiana, Slovenia, septembre 2023, Proceedings: 1888-1892.
Obein G., « De Nouvelles métriques pour la LED ? », Journée LED 2050: évolutions, révolutions…, Paris, France, 3 octobre 2023.
Gevaux L., Saha D., Morvan K. and Obein G., “µBRDF measurements & traceability challenges”, CORM-CNC/CIE-CIE-USNC Biennial Joint Conference 2023, online, 6 novembre 2023.
Dupiau A., Gevaux L., Saez, A.M. and Ferrero, A., “High dynamic range merging algorithms for traceable luminance imaging”, IS&T/APPAMAT Workshop on material appearance, Paris, France, 13 novembre 2023.
Gevaux L., Simonot L., Clerc R. and Hébert M., “Edge-loss effect in skin reflectance measurements”, IS&T/APPAMAT Workshop on material appearance, Paris, France, 13 novembre 2023.